Methods for bonding wafers of known good dies, and assemblies resulting from such methods
AssigneeMicron Technology, Inc.
InventorsBharat Bhushan, Akshay N. Singh, Kunal R. Parekh
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AssigneeMicron Technology, Inc.
InventorsBharat Bhushan, Akshay N. Singh, Kunal R. Parekh
Estimating the term…
A method of forming a semiconductor wafer is provided. The method includes dicing wafers into dies, testing the dies for known good dies, and bonding known good dies to a carrier wafer to form a top KGD wafer. The method also includes filling gaps between top dies to form a top gap-fill layer around and above each of the top dies, and bonding the top dies with a dummy silicon wafer. The method also includes bonding known good dies to carrier wafers to form one or more core KGD wafers, as well as filling gaps between the core dies to form a core gap-fill layer around each of the core dies. The method then includes bonding the one or more core KGD wafers to the top KGD wafer to form a KGD wafer stack.
A method for bonding known-good-die (KGD) wafers to form a known-good-die (KGD) wafer stack, comprising:
A semiconductor device assembly, comprising:
A semiconductor device assembly, comprising:
Dependencies are inferred from the claim text.