Semiconductor device and method for manufacturing the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsGulbagh SINGH, Tsung-Han TSAI, Shih-Lu HSU, Kun-Tsang CHUANG
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsGulbagh SINGH, Tsung-Han TSAI, Shih-Lu HSU, Kun-Tsang CHUANG
Estimating the term…
A semiconductor device may include a source on a first side of a gate. The semiconductor device may include a drain on a second side of the gate, where the second side of the gate is opposite to the first side of the gate. The semiconductor device may include a first contact over the source. The semiconductor device may include a second contact over the drain. The semiconductor device may include an air gap over the gate between at least the first contact and the second contact. The semiconductor device may include at least two dielectric materials in each of a region between the air gap and the first contact and a region between the air gap and the second contact.
A method, comprising:
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Dependencies are inferred from the claim text.