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US 2025/0095977 A1Published application
Specimen support, ionization method, and mass spectrometry method
AssigneeHamamatsu Photonics K.K.
InventorsTakamasa IKEDA, Masahiro KOTANI, Takayuki OHMURA
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Abstract
A sample support includes: a substrate having a first surface, a second surface opposite to the first surface, and a porous structure opening at least to the first surface; a protective layer provided to cover a surface of the porous structure; and a conductive layer provided so as to cover a portion of the protective layer at least provided on the first surface.
Claims11
A sample support for ionizing a sample, comprising:
- a substrate having a first surface, a second surface opposite to the first surface, and a porous structure opening at least to the first surface;
- a protective layer provided to cover a surface of the porous structure;
- and
- a conductive layer provided so as to cover a portion of the protective layer at least provided on the first surface.
1 more element
Dependencies are inferred from the claim text.