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AssigneesSK hynix Inc., SK Hynix NAND Product Solutions Corp. (dba Solidigm)
InventorsPengfei HUANG, Zion KWOK, Fan ZHANG
Estimating the term…
This application is directed to data validation in an electronic device having a memory device. The memory device receives an inquiry for a validity condition of a page of the memory device from a memory controller that is coupled to the memory device in a memory system. In response to the inquiry, the memory device selects a subset of the page of the memory device to represent the page. The subset of the page stores a set of memory data. The memory device obtains integrity data corresponding to the set of memory data, applies a plurality of validation operations on the set of memory data and the integrity data corresponding to the set of memory data to generate a plurality of validity results. The memory device determines an error parameter of the page locally based on the plurality of validity results and provides the error parameter to the memory controller.
A method implemented at a memory device, comprising:
A memory system, comprising:
A non-transitory computer-readable storage medium storing one or more programs to be executed by one or more processors for compressing check node data, the one or more programs comprising instructions for:
The non-transitory computer-readable storage medium of claim 17, wherein the inquiry includes an identifier of the page in the memory device, the method further comprising:
Dependencies are inferred from the claim text.