Built-in self test with current measurement for analog circuit verification

A method that comprises testing multiple integrated circuit devices from a given manufacturing batch, the testing including, for each of the multiple integrated circuit devices:

• powering an analog circuit block with a current flow from a first power rail;
• iterating through a sequence of operating modes for the analog circuit block;
• for each operating mode in the sequence, storing a digital measurement of the current flow corresponding to that operating mode;
• transferring a device signature that includes the stored digital measurements to an external tester;
• and
• failing the integrated circuit device if the device signature is not consistent with device signatures of other ones of the multiple integrated circuit devices.

An integrated circuit device that comprises:

• multiple analog circuit blocks each coupled between a first power rail and an intermediate power node;
• a current sensor coupled between the intermediate power node and a second power rail, the current sensor configured to provide digital measurements of current flow between the intermediate power node and the second power rail;
• and
• a sequencer configured to iterate through the multiple analog circuit blocks, enabling one at a time pursuant to a test pattern, the test pattern further specifying a sequence of operating modes for the enabled analog circuit block, and the sequencer further configured to capture a digital measurement of the current flow for each operating mode of each analog circuit block.