Impedance measuring device and method
AssigneeHioki E.E. Corporation
InventorsKazuaki HANEDA, Tomohiro YOKOYAMA
Life of this patent
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AssigneeHioki E.E. Corporation
InventorsKazuaki HANEDA, Tomohiro YOKOYAMA
Estimating the term…
An impedance measuring device capable of reducing influence of noise near a measurement frequency, and performing highly accurate measurement is provided. The problem can be solved by an impedance measuring device or the like, including: a signal generation unit that generates a first reference signal, and a second reference signal that is obtained by inverting a phase of the first reference signal at an interval of a predetermined inversion period; a measurement signal supply unit that produces a measurement signal based on the second reference signal, and supplies the measurement signal to a measurement object; a measuring unit that synchronously detects a signal occurring in the measurement object due to the measurement signal, using a modulation signal produced based on the first reference signal, and further produces a filtered signal by low-pass filtering the detected signal; and an arithmetic unit that determines impedance of the measurement object, based on an added average of a magnitude of the filtered signal when the first reference signal and the second reference signal are in phase, and a magnitude of the filtered signal with inverted sign when the first reference signal and the second reference signal are in anti-phase.
An impedance measuring device comprising:
An impedance measuring device comprising:
A method comprising steps of:
A method comprising steps of:
Dependencies are inferred from the claim text.