Subcellular self-tracer ion imaging and localization method of metal elements

Abstract

Provided is a subcellular self-tracer ion imaging and localization method of metal elements. Wherein, the above method includes: using the SEM-FIB-TOF-SIMS system to perform subcellular structure imaging and metal ion imaging on the sample slice, wherein in the SEM-FIB-TOF-SIMS system, the scanning electron microscope (SEM) is used to perform subcellular structure imaging on the sample slice; and the focused ion beam (FIB) is used to perform surface bombardment on the subcellular structures, and the secondary ions excited are detected by the time-of-flight secondary ion mass spectrometry (TOF-SIMS) to obtain the ion information in the analysis area and imaged.

Dependencies are inferred from the claim text.