Device for fabricating specimen for testing adhesive force of electrode active material layer and method for fabricating specimen for testing adhesive force of electrode active material layer by using same

Abstract

A device used for fabricating a specimen for testing an adhesive force between an electrode active material layer and a current collector may include a lower guide panel having a guide groove on an upper surface of the lower guide panel. The guide groove may guide and accommodate a fixing substrate to which the electrode active material layer is adhered. The device may also include an upper guide panel having a guide hole for guiding an adhesion position of the electrode active material layer to the fixing substrate accommodated in the guide groove. The upper guide panel may be provided with a coupler for the upper portion of the lower guide panel. A method is also disclosed for fabricating the specimen using the device.

Dependencies are inferred from the claim text.