A method for operating a sensor system with a MEMS gyroscope, the sensor system including:
- a drive circuit, which is configured to generate an analog drive signal for driving an oscillatable seismic element of the MEMS gyroscope and includes a first interface amplifier of a drive detection circuit, wherein the drive detection circuit, due to a movement of the oscillatable seismic element in a drive direction, detects a first analog signal that is supplied to an input of the first interface amplifier,
- a detection circuit, which is coupled to the drive circuit and the oscillatable seismic element and includes a second interface amplifier, wherein the detection circuit, due to a movement of the oscillatable seismic element in a detection direction substantially perpendicular to the drive direction, detects a second analog signal that is supplied to an input of the second interface amplifier, wherein the second analog signal includes an analog rotation rate signal component and an analog quadrature signal component,
- a quadrature compensation circuit, a digital test signal generator circuit, and a digital-to-analog converter, wherein an output of the digital-to-analog converter is connected via a first switch-capacitance structure to the input of the first interface amplifier and via a second switch-capacitance structure to the input of the second interface amplifier;
- the method comprising the following steps:
- in a first method step, applying by the quadrature compensation circuit with the drive detection circuit an analog compensation signal of the quadrature compensation circuit for compensating the analog quadrature signal component to the input of the second interface amplifier;
- in a second method step, applying by the digital test signal generator circuit a digital test signal to the digital-to-analog converter for conversion into an analog test signal;
- wherein the analog test signal is applied to the first interface amplifier using the first switch-capacitance structure and/or to the second interface amplifier using the second switch-capacitance structure;
- wherein, using the analog test signal, a first analog test signal is provided by the first switch-capacitance structure;
- wherein, using the analog test signal, a second analog test signal is provided by the second switch-capacitance structure;
- and
- wherein a phase difference is detected by selectively applying the first analog test signal and/or by selectively applying the second analog test signal to an input of the first interface amplifier and/or of the second interface amplifier in each case.