Systems and methods for lab generation, test management and device monitoring
AssigneeLabScale Technologies, Inc.
InventorsDavid Tse, Scott Vail, Huacong Cai, Raika Qawam, Craig Griffin
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AssigneeLabScale Technologies, Inc.
InventorsDavid Tse, Scott Vail, Huacong Cai, Raika Qawam, Craig Griffin
Estimating the term…
A test automation system for efficiently testing a wide range of devices, including embedded devices, IoT devices, mobile devices, and edge AI devices, is disclosed. The system employs a unique architecture and technical solutions to overcome limitations of existing testing platforms. It provides a comprehensive and flexible testing solution by incorporating modular components. The system includes a device integration package (DIP) that enables the system to communicate with and test any type of device. The system enables efficient management of diverse device types, streamlined test case creation and execution, and intelligent analysis of test results. Through its innovative design, the test automation system addresses the technical challenges associated with testing heterogeneous devices, enhancing the efficiency and effectiveness of the testing process. The system's adaptability and scalability make it suitable for testing a wide range of devices in various industries, including telecommunications, automotive, and consumer electronics.
A computer implemented method for device testing and management, the computer implemented method comprising:
A computing system for device testing and management, the computing system comprising:
A non-transitory computer readable medium comprising instructions that when executed by a processor enable the processor to:
Dependencies are inferred from the claim text.