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US 2025/0086080 A1Published application
Functional testing method
AssigneesInventec (Pudong) Technology Corporation, Inventec Corporation
InventorsChih-Jen CHIN, Cheng-Hung WU, Yi-Ping YANG
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Abstract
A functional testing method, adapted to a device under test, includes, by a main control chip, performing: requesting a test script according to identification information of the device under test from a database server, wherein the test script comprises a plurality of testing items of different types, and testing the device under test according to the test script.
Claims7
A functional testing method, adapted to a device under test, and comprising, by a main control chip, performing:
- requesting a test script according to identification information of the device under test from a database server, wherein the test script comprises a plurality of testing items of different types;
- and
- testing the device under test according to the test script.
Dependencies are inferred from the claim text.