System and method for implementing temperature compensation in a memory device
AssigneeSilicon Storage Technology here.
InventorsGilles Festes, Steven Lemke, Louisa Schneider, Henry A. Om'mani, Hieu Van Tran
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AssigneeSilicon Storage Technology here.
InventorsGilles Festes, Steven Lemke, Louisa Schneider, Henry A. Om'mani, Hieu Van Tran
Estimating the term…
A method of operating memory cells includes programming memory cells at a first temperature to different program states associated with first read current values confirmed by using nominal read conditions. Modified read conditions are determined such that a second read current for the one memory cells at a second temperature is approximately equal to the first read current value for the one memory cell. A read operation is performed on the memory cells at the second temperature using the modified read conditions to determine respective third read current values. Error read current values are determined as respective differences between the first and third read current values. Upper and lower program states are assigned to respective desired program states, with read currents that correspond approximately to respective determined error read current values, and are separated approximately by a respective target read current value associated with the respective desired program state.
A method of operating a plurality of memory cells, comprising:
A memory device, comprising:
Dependencies are inferred from the claim text.