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AssigneeKabushiki Kaisha Toshiba
InventorsWataru WATANABE, Jumpei ANDO, Toshiyuki ONO
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According to one embodiment, an abnormality detection apparatus includes a processor. The processor acquires analysis data, the analysis data including at least operation data among the operation data and history data, the operation data being data of a manufacturing apparatus configured to intermittently process at least one product, the history data relating to a manufacturing history of the product processed by the manufacturing apparatus. The processor sets an operational state of the manufacturing apparatus in the operation data based on the acquired analysis data. The processor detects abnormality of the manufacturing apparatus based on the operation data and the set operational state.
An abnormality detection apparatus comprising a processor configured to:
An abnormality detection method comprising:
A non-transitory computer readable medium including computer executable instructions, wherein the instructions, when executed by a processor, cause the processor to perform a method comprising:
Dependencies are inferred from the claim text.