Automated test system and method thereof

An automated test system, which is configured to provide a test platform to perform a plurality of tests on a device under test, the test platform comprising a plurality of stations, and the automated test system comprising:

• an initial setting module configured to execute an initial setting basic function and an initial setting station function in sequence, wherein the initial setting basic function obtains a test setup file corresponding to the device under test from one of the stations and reads a device basic information from the test setup file and sets a platform setting data according to the device basic information, and the initial setting station function sets an operating mode of a fixture and turns on the fixture;
• a pre-test module configured to execute a pre-test basic function and a pre-test station function, wherein the pre-test basic function resets the test setup file from a previous testing, and the pre-test station function confirms whether a device serial number of the device under test complies with a serial number rule and confirms whether the device under test is in a retest state according to the device serial number;
• a test module configured to execute a test initializing station function, a test initializing basic function and a test function in sequence, wherein the test initializing station function resets a program parameter and turns off the fixture, the test initializing basic function confirms whether the device under test is applied to a test item of the one of the stations according to the device basic information and initializes a test data corresponding to the device under test according to the test item, and the test function tests the device under test based on the test data and generates a test result;
• and
• a post-test module configured to execute a post-test station function and a post-test basic function in sequence, wherein the post-test station function turns on the fixture, and the post-test basic function uploads the test result to a central server and confirms whether to receive an upload status from the central server;
• wherein the one of the stations overwrites the initial setting basic function, the pre-test basic function, the test initializing basic function and the post-test basic function according to the test item to generate the initial setting station function, the pre-test station function, the test initializing station function and the post-test station function.

An automated test method, which is configured to provide a test platform to perform a plurality of tests on a device under test, the test platform comprising a plurality of stations, and the automated test method comprising:

• performing an initial setting step comprising configuring an initial setting module to execute an initial setting basic function and an initial setting station function in sequence, wherein the initial setting basic function obtains a test setup file corresponding to the device under test from one of the stations and reads a device basic information from the test setup file and sets a platform setting data according to the device basic information, and the initial setting station function sets an operating mode of a fixture and turns on the fixture;
• performing a pre-test step comprising configuring a pre-test module to execute a pre-test basic function and a pre-test station function, wherein the pre-test basic function resets the test setup file from a previous testing, and the pre-test station function confirms whether a device serial number of the device under test complies with a serial number rule and confirms whether the device under test is in a retest state according to the device serial number;
• performing a testing step comprising configuring a test module to execute a test initializing station function, a test initializing basic function and a test function in sequence, wherein the test initializing station function resets a program parameter and turns off the fixture, the test initializing basic function confirms whether the device under test is applied to a test item of the one of the stations according to the device basic information and initializes a test data corresponding to the device under test according to the test item, and the test function tests the device under test based on the test data and generates a test result;
• and
• performing a post-test step comprising configuring a post-test module to execute a post-test station function and a post-test basic function in sequence, wherein the post-test station function turns on the fixture, and the post-test basic function uploads the test result to a central server and confirms whether to receive an upload status from the central server;
• wherein the one of the stations overwrites the initial setting basic function, the pre-test basic function, the test initializing basic function and the post-test basic function according to the test item to generate the initial setting station function, the pre-test station function, the test initializing station function and the post-test station function.