Film-forming method and film-forming apparatus
AssigneeTokyo Electron Limited
InventorsYohei MATSUYAMA, Ken OKOSHI, Yuki KIKUCHI
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AssigneeTokyo Electron Limited
InventorsYohei MATSUYAMA, Ken OKOSHI, Yuki KIKUCHI
Estimating the term…
A film-forming method according to an aspect of the present disclosure forms a film containing a silicon atom and a nitrogen atom on a surface of a substrate including a metal film at the surface of the substrate. The film-forming method includes: supplying a boron-containing gas and a first nitriding gas to the substrate, thereby forming a first film on the surface, the first film containing a boron atom and a nitrogen atom; and supplying a silicon-containing gas and a second nitriding gas to the substrate, thereby forming a second film on the first film, the second film containing a silicon atom and a nitrogen atom.
A film-forming method for forming a film containing a silicon atom and a nitrogen atom on a surface of a substrate including a metal film at the surface of the substrate, the film-forming method comprising:
A film-forming apparatus configured to form a film containing a silicon atom and a nitrogen atom on a surface of a substrate including a metal film at the surface of the substrate, the film-forming apparatus comprising:
Dependencies are inferred from the claim text.