Method of manufacturing semiconductor device and semiconductor device
AssigneeCanon Anelva Corporation
InventorsNaoko MATSUI, Yuto YOSHIDA, Toshikazu IRISAWA
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AssigneeCanon Anelva Corporation
InventorsNaoko MATSUI, Yuto YOSHIDA, Toshikazu IRISAWA
Estimating the term…
Method of manufacturing semiconductor device includes conversion step of converting amorphous silicon into single-crystal silicon. The conversion step includes first step of forming silicide to contact the amorphous silicon by forming, by treatment with heating, first film containing first material to cover the amorphous silicon, second step of forming compound formed by Si, the first material, and second material to contact the silicide by forming, by treatment with heating, second film containing the second material to cover the silicide, and third step of changing the silicide remaining after the second step to the compound by annealing. The first material is one of Ni, Pd, Ti, Cu, Pt, Co, Mo, Mg, W, Cr, and Mn. The second material is one of Al, Au, Sb, In, Ag, and Ga.
A method of manufacturing a semiconductor device, including a conversion step of converting amorphous silicon into single-crystal silicon, wherein
A method of manufacturing a semiconductor device, including a conversion step of converting amorphous silicon into single-crystal silicon, wherein
A semiconductor device including a stacked structure of amorphous silicon, a compound, and single-crystal silicon, wherein
Dependencies are inferred from the claim text.