Method and apparatus for determining parameter of layout quality detection tool, device, and medium

An electronic device comprising a processor and a memory, the memory having at least one computer program stored therein that, when loaded and executed by the processor, causes the electronic device to implement a method for determining a parameter of a layout quality detection tool including:

• performing a quality detection on an original chip layout by using a layout quality detection tool according to a plurality of first base values of a target parameter of the layout quality detection tool to obtain quality indicators corresponding to the first base values;
• when the quality indicators corresponding to the first base values do not meet a reference condition, determining a first reference value from a plurality of first candidate values of the target parameter of the layout quality detection tool based on the quality indicators corresponding to the first base values, and determining a plurality of second base values of the target parameter based on the plurality of first base values and the first reference value;
• performing a quality detection on the original layout by using the layout quality detection tool according to the plurality of second base values to obtain quality indicators corresponding to the second base values;
• and
• when the quality indicators corresponding to the second base values meet the reference condition, determining a target value of the target parameter based on the second base values for adjusting the layout quality detection tool to determine a quality indicator of a to-be-detected chip layout.

A non-transitory computer-readable storage medium having at least one computer program stored therein that, when loaded and executed by a processor of an electronic device, causes the electronic device to implement a method for determining a parameter of a layout quality detection tool including:

• performing a quality detection on an original chip layout by using a layout quality detection tool according to a plurality of first base values of a target parameter of the layout quality detection tool to obtain quality indicators corresponding to the first base values;
• when the quality indicators corresponding to the first base values do not meet a reference condition, determining a first reference value from a plurality of first candidate values of the target parameter of the layout quality detection tool based on the quality indicators corresponding to the first base values, and determining a plurality of second base values of the target parameter based on the plurality of first base values and the first reference value;
• performing a quality detection on the original layout by using the layout quality detection tool according to the plurality of second base values to obtain quality indicators corresponding to the second base values;
• and
• when the quality indicators corresponding to the second base values meet the reference condition, determining a target value of the target parameter based on the second base values for adjusting the layout quality detection tool to determine a quality indicator of a to-be-detected chip layout.