Method for assessing condition of an irradiated electronic device

Abstract

A method includes the steps of energizing, in a test fixture with a combination of a power signal and a clock signal, an electrical device selected from a plurality of electrical devices, measuring a first value of a parameter of the electrical device in a first emission of an electromagnetic energy in a radio frequency (RF) spectrum emitted from energized electrical device, irradiating the electrical device, irradiating the electrical device with a radiation dose in a radiation type, measuring a second value of the parameter in the second emission of the electromagnetic energy in the RF spectrum emitted from the energized and irradiated electrical device, measuring a difference between the first value and the second value, and determining a condition of the electrical device based on a measured difference.

Dependencies are inferred from the claim text.