Temperature control method and substrate processing apparatus
AssigneeTokyo Electron Limited
InventorsHisashi INOUE, Tatsuya YAMAGUCHI, Noriaki KOYAMA, Yuichi TAKENAGA, Tatsuya WATANABE
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Electron Limited
InventorsHisashi INOUE, Tatsuya YAMAGUCHI, Noriaki KOYAMA, Yuichi TAKENAGA, Tatsuya WATANABE
Estimating the term…
A temperature control method includes providing a substrate processing apparatus including a processing container, and a heater that heats the processing container; setting an amount of temperature change with respect to a target temperature having a value up to a second digit smaller than a first digit indicating a control limit value of the heater; dividing the amount of temperature change into a first temperature equal to or greater than the first digit and a second temperature less than the first digit, and calculating a ratio of dividing a time segmented by a digit difference between the first digit and the second digit, into a first time corresponding to the second temperature and a second time other than the first time; and controlling the heater to raise or lower a temperature in times before and after dividing a processing time in a processing step at the ratio.
A temperature control method comprising:
A substrate processing apparatus comprising:
Dependencies are inferred from the claim text.