Temperature adjustment system and electronic component testing apparatus

A temperature adjustment system for adjusting a temperature of a device under test (DUT) electrically connected to a socket, the temperature adjustment system comprising:

• a first temperature adjustment device that supplies a fluid to an internal space in either the socket or a contact member that contacts the DUT when the DUT is pressed against the socket;
• and
• a second temperature adjustment device that adjusts a temperature of an atmosphere in a chamber in which the socket and the contact member are disposed, wherein
• the first temperature adjustment device comprises a first supplier that supplies a first fluid,
• the first supplier comprises:
• one or more connectors connected to one or more supply sources that supply the first fluid;
• and
• a heat exchanger disposed between the one or more connectors and the internal space, and
• the heat exchanger has a heat exchange part exposed in the chamber and exchanges heat between the first fluid and the atmosphere in the chamber.