Sampling High Power Beam Profiling

Abstract

The present invention introduces a high-power beam profiling system with versatile beam sampling capabilities, designed specifically for measuring multi-kilowatt laser beams. To overcome the limitations of traditional sampling devices that scan the laser beam for measurements, my invention employs a rotating beam sampler. This sampler swiftly traverses the beam for a brief period, capturing a momentary sample which is then reflected to a preferred measuring device such as a camera beam profiler. By capturing a snapshot of the beam, the camera determines the beam size efficiently. The device is inherently cooled by the rotating sampler's movement in the air, coupled with the assistance of external cooling nozzles. It comprises a low-reflectivity mirror, a mechanical arrangement for precise positioning of the mirror, a rotating motor, an additional low-reflectivity mirror, a beam profiling camera, and the necessary micro-controller and algorithm for image processing and calculating the beam profiles.

Dependencies are inferred from the claim text.