Silicon Carbide Crystal Growth Device and Quality Control Method
AssigneeWinsheng Material Technology Co., Ltd.
InventorsYun-Fu Chen, Wei-Tse Hsu, Min-Sheng Chu, Chien-Li Yang, Tsu-Hsiang Lin, Yuan-Hong Huang
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AssigneeWinsheng Material Technology Co., Ltd.
InventorsYun-Fu Chen, Wei-Tse Hsu, Min-Sheng Chu, Chien-Li Yang, Tsu-Hsiang Lin, Yuan-Hong Huang
Estimating the term…
Provided are a silicon carbide crystal growth device and a quality control method. The device includes: an annealing unit, a crystal growth unit, an atmosphere control unit, and a transport system; the atmosphere control unit provides a gas environment with low water, oxygen and nitrogen; the transport system transports a plurality of target objects after high-temperature purification by the annealing unit to the atmosphere control unit; after assembling silicon carbide seed crystal and silicon carbide powder in a graphite crucible and covering with thermal insulation material to form a container inside the atmosphere control unit, the transport system transports the container to the crystal growth unit. The method uses a weighing system in a chamber of the crystal growth unit to detect a weight change of silicon carbide seed crystal and silicon carbide powder during a crystal growth process through a plurality of weight sensors of the weighing system.
A silicon carbide crystal growth device, comprising:
A quality control method for silicon carbide crystal growth, comprising:
Dependencies are inferred from the claim text.