Uncertainty estimation for a position reconstruction of semiconductor components on a wafer
OwnerEric Sebastian Schmidt, Stefan Patrick Lindtinventors
Life of this patent
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OwnerEric Sebastian Schmidt, Stefan Patrick Lindtinventors
Estimating the term…
A method for estimating an uncertainty of an assignment rule that assigns first variables from a first set of first variables to second variables from a second set of second variables. The method includes: ascertaining inaccuracies of a machine learning system trained with the assignment rule, wherein the inaccuracies are ascertained by means of a difference between the second variables predicted by the machine learning system depending on the first variables and the second variables assigned to the first variables according to the assignment rule; ascertaining a covariance matrix depending on the ascertained inaccuracies; ascertaining a likelihood matrix and normalizing the likelihood matrix by dividing the value of the likelihood matrix by the corresponding column sum.
1-11. (canceled)
A method for estimating an uncertainty of an assignment rule that assigns first variables from a first set of first variables to second variables from a second set of second variables, comprising the following steps:
A device configured to estimate an uncertainty of an assignment rule that assigns first variables from a first set of first variables to second variables from a second set of second variables, the device configured to:
A non-transitory machine-readable storage medium on which is stored a computer program for estimating an uncertainty of an assignment rule that assigns first variables from a first set of first variables to second variables from a second set of second variables, the computer program, when executed by a computer, causing the computer to perform the following steps:
Dependencies are inferred from the claim text.