A method of making a semiconductor structure, comprising:
- seating a substrate within a chamber arrangement;
- depositing a boron-doped silicon germanium (SiGe:B) layer onto the substrate;
- and
- depositing a boron-doped silicon (Si:B) layer onto the SiGe:B layer;
- wherein depositing the Si:B layer comprises:
- ceasing flow of a boron-containing precursor to the chamber arrangement;
- decreasing flow of a germanium-containing precursor to the chamber arrangement;
- increasing flow of a silicon-containing precursor to the chamber arrangement;
- ceasing, after increasing flow of the silicon-containing precursor, flow of the germanium-containing precursor to the chamber arrangement;
- and
- resuming flow of the boron-containing precursor to the chamber arrangement.