Machine Learning Model Fingerprinting
AssigneeHiddenLayer, Inc.
InventorsDavid Beveridge, Andrew Davis
Life of this patent
Estimating the term…
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AssigneeHiddenLayer, Inc.
InventorsDavid Beveridge, Andrew Davis
Estimating the term…
Data is received that characterizes artefacts associated with each of a plurality of layers of a first machine learning model. Fingerprints are then generated for each of the artefacts in the layers of the first machine learning model. These generated fingerprints collectively form a model indicator for the first machine learning model. It is then determined whether the first machine learning model is derived from another machine learning model by performing a similarity analysis between the model indicator for the first machine learning model and model indicators generated for each of a plurality of reference machine learning models each comprising a respective set of fingerprints. Data characterizing the determination can be provided to a consuming application or process. Related apparatus, systems, techniques and articles are also described.
A method comprising:
A method comprising:
A system comprising:
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