Electrical Testing for Panel Characterization and Defect Screening
AssigneeApple Inc.
InventorsXuebei Yang, Chung-Lun E Hsu, Cheuk Chi Lo, Hasan Akyol, Yingkan Lin, John T Wetherell, Han Zhao
Life of this patent
Estimating the term…
Loading patent…
AssigneeApple Inc.
InventorsXuebei Yang, Chung-Lun E Hsu, Cheuk Chi Lo, Hasan Akyol, Yingkan Lin, John T Wetherell, Han Zhao
Estimating the term…
Systems and methods are provided for electrical testing to supplement or replace optical testing of an electronic display. Internal testing circuitry that includes analog front end (AFE) and analog-to-digital converter (ADC) circuitry may be included in the electronic display and may be used either alone or in combination with other testing devices to perform electrical characterization and defect screening. The electrical characterization and defect screening may be performed before or after self-emissive elements such as light-emitting diodes are installed, further improving yield. Types of electrical characterization and defect screening may include a partial passive mode electrical characterization of OLEDs, vertical or horizontal crosstalk measurement, scan line integrity testing, pixel bright dot testing, display pixel defect detection, and delayed defect detection for defects that may occur after some extended period of time (e.g., after several minutes, after several hours).
A system comprising:
A method comprising:
A method comprising:
A method comprising:
A method comprising:
Dependencies are inferred from the claim text.