Scanning probe microscope and program

A scanning probe microscope comprising:

• a probe configured to be arranged to face a surface of a sample;
• a scanner configured to move a relative position between the sample and the probe;
• a drive unit configured to drive the scanner to scan the surface of the sample for each of a plurality of regions acquired by dividing an observation target region of the sample into the plurality of regions;
• a data processing unit configured to acquire a plurality of pieces of image data corresponding to the plurality of regions, respectively, as observation images of the observation target region;
• and
• an input means configured to accept a user input regarding a condition for acquiring the plurality of pieces of image data,
• wherein the data processing unit is configured to set the condition based on the user input, the condition including a scanning condition of the scanner, and
• wherein when the input means accepts the user input for any two variables out of three variables consisting of a scanning range of the scanner for each image data, a spacing between two adjacent scanning ranges, and a maximum number of fields of view capable of being obtained from a maximum scanning range of the scanner, the data processing unit is configured to calculate a remaining one of the three variables based on the accepted two variables by executing arithmetic processing using a relation between the three variables.