Autofocus assistance method, autofocus assistance device, and autofocus assistance program
AssigneeHamamatsu Photonics K.K.
InventorsAkira SHIMASE, Tomochika TAKESHIMA, Akari ITO
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AssigneeHamamatsu Photonics K.K.
InventorsAkira SHIMASE, Tomochika TAKESHIMA, Akari ITO
Estimating the term…
An autofocus support method according to an embodiment supports autofocus for a semiconductor device having a substrate and a device pattern formed on one main surface side of the substrate. The method includes: a step of acquiring a first image focused on the substrate; a step of acquiring a spatial frequency image from the first image by Fourier transform and generating mask data for masking linear patterns in the same direction on the substrate based on the spatial frequency image; a step of performing filtering on a plurality of second images, which are captured by using an imaging device while changing the focal position of the imaging device on the other main surface side of the substrate, by using the mask data; and a step of focusing the imaging device on the device pattern based on the second image after filtering.
An autofocus support method for a semiconductor device having a substrate and a device pattern formed on one main surface side of the substrate, the autofocus support method comprising:
An autofocus support device, comprising:
A non-transitory computer-readable storage medium storing an autofocus support program for supporting autofocus for a semiconductor device having a substrate and a device pattern formed on one main surface side of the substrate, the program causing a computer to function as:
Dependencies are inferred from the claim text.