Monitors for pressurized systems

A probe tip, comprising:

• a first portion configured to connect to a sensing assembly, the first portion having a first width in a direction normal to a central axis of the probe tip, the first portion also having a first internal cavity that includes at least a portion of the central axis of the probe tip;
• a second portion connected to the first portion, the second portion having a second width in a direction normal to the central axis of the probe tip, the second width being larger than the first width and defining an external surface of the second portion configured to engage with an external object;
• and
• a temperature sensing element configured to generate a sensing signal representing a temperature of the external object, the temperature sensing element being secured to an internal surface of the second portion, the internal surface being opposite and in thermal communication with the external surface.