US 2024/0371620 A1 · ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE PULSE CIRCUIT, AND SELECTION CIRCUIT

Abstract

A method and a system for selecting ions in a mass spectrometer. The method comprises: applying a first voltage to a deflection conductor to generate a deflection electric field at the deflection conductor, where ions are deflected to a trajectory not reaching the detector when flying through the deflection electric field; maintaining the first voltage applied to the deflection conductor to deflect non-target ions which fly out of the acceleration electric field, in response to detecting that a pulse synchronized with a laser is outputted; applying a second voltage to the deflection conductor to stop generating the deflection electric field and enable target ions to reach the detector, in response to the target ions flying out of the acceleration electric field; and applying the first voltage to the deflection conductor, in response to all target ions flying past the deflection conductor.

Claims15

Dependent claims

A method for selecting ions in a mass spectrometer, wherein a deflection conductor is disposed at a side of an ion-flight path between an acceleration electric field and a detector in the mass spectrometer, and the method comprises:

applying a first voltage to the deflection conductor to generate a deflection electric field at the deflection conductor, wherein ions are deflected to a trajectory not reaching the detector when flying through the deflection electric field;
maintaining the first voltage applied to the deflection conductor to deflect non-target ions, among the ions, which fly out of the acceleration electric field, in response to detecting that a pulse synchronized with a laser is outputted;
applying a second voltage to the deflection conductor to stop generating the deflection electric field and enable target ions, among the ions, to reach the detector, in response to the target ions flying out of the acceleration electric field;
and
applying the first voltage to the deflection conductor, in response to all of the target ions flying past the deflection conductor.

2 more elements

A system for selecting ions in a mass spectrometer, comprising:

a controller, of which an input terminal is connected to a laser source configured to output a laser pulse;
and
a circuit for selecting ions, wherein an output terminal of the circuit is connected to a deflection conductor disposed in the mass spectrometer, and an input terminal of the circuit is connected to the controller;
wherein the controller is configured to control the circuit for selecting ions to output a voltage, which is switched between a first voltage and a second voltage, to the deflection conductor to implement any forgoing method for selecting ions in the mass spectrometer.

1 more element

A high-voltage pulse circuit, comprising a first voltage source, a second voltage source, a pulse circuit, and an RC series circuit, wherein:

a difference between a voltage outputted by the first voltage source and a voltage outputted by the second voltage source is not less than a preset voltage;
the pulse circuit comprises a voltage divider and a transistor that are connected in series;
a terminal of the pulse circuit is connected to the first voltage source, and another terminal of the pulse circuit is connected to the second voltage source;
a node at which the voltage divider and the transistor are connected serves as an output terminal of the high-voltage pulse circuit;
a first terminal of the RC series circuit is connected to the output terminal of the high-voltage pulse circuit, and a second terminal of the RC series circuit is connected to the second voltage source;
and
the transistor is configured to switch between on and off according to a switch controlling signal received by a control terminal of the transistor.

4 more elements

Dependencies are inferred from the claim text.

Ion screening method and system for mass spectrometer, high-voltage pulse circuit, and selection circuit

Life of this patent

Ion screening method and system for mass spectrometer, high-voltage pulse circuit, and selection circuit

Life of this patent

Abstract

Claims15