Waveform-analyzing method, waveform-analyzing device, and analyzing system
AssigneeShimadzu Corporation
InventorsHitomi YOSHIYAMA-KITAJIMA, Shinji KANAZAWA
Life of this patent
Estimating the term…
Loading patent…
AssigneeShimadzu Corporation
InventorsHitomi YOSHIYAMA-KITAJIMA, Shinji KANAZAWA
Estimating the term…
A model for locating a peak portion in a chromatogram or similar waveform is trained by machine learning using multiple sets of partial waveforms prepared by dividing each reference waveform having a known peak position. An analysis-target waveform is divided into partial waveforms, and whether or not a partial waveform is a peak portion is determined for each partial waveform by the trained model, to estimate different kinds of regions in the analysis-target waveform, including an overlap-peak region. For an overlap peak within a region estimated to be an overlap-peak region, whether or not that peak is a multimodal peak originating from one component is determined, using at least the height of a peak in the overlap peak, the depth of the trough between two neighboring peaks, or the horizontal width of the portion between the bottom of the trough and the top of one of the neighboring peaks.
A waveform-analyzing method for analyzing a signal waveform which is a chromatogram or a spectrum, the method comprising:
A waveform-analyzing device configured to analyze a signal waveform which is a chromatogram or a spectrum, the device comprising:
Dependencies are inferred from the claim text.