Tandem mass spectrometer and method of tandem mass spectrometry

Abstract

A method of tandem mass spectrometry for analysing precursor ions across a mass to charge (m/z) range of interest is provided. The method comprises analysing some of the precursor ions across the m/z range of interest in the MS1 domain using a first mass analyser of a tandem mass spectrometer operated at a first sensitivity. The method also comprises analysing some of the precursor ions across the m/z range of interest in the MS1 domain using a second mass analyser of the tandem mass spectrometer operated at a second sensitivity, wherein the second sensitivity is higher than the first sensitivity. The analysis in the MS1 domain performed by the second mass analyser is performed concurrently with the analysis performed in the MS1 domain by the first mass analyser. The method also comprises combining data from the MS1 analyses performed by the first and second mass analysers to identify and/or quantify precursor ions. The method also comprises analysing some of the precursor ions in the MS2 domain using the second mass analyser of the tandem mass spectrometer.

Dependencies are inferred from the claim text.