Current collectors comprising metallised films
AssigneeDuPont Teijin Films U.S. Limited Partnership
InventorsStephen Sankey, Stephen Jones, Pedro Nunes, Lucien Schosseler
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Abstract
A current collector comprising a biaxially oriented polymeric substrate layer and a first metal layer on a side of the polymeric substrate layer, wherein the polymeric substrate layer exhibits positive thermal expansion in air at 200° C. in each of the transverse direction (TD) and machine direction (MD). The polymeric substrate layer has a thickness of no more than 12 pm and the first metal layer has a thickness of no more than 1000 nm.
Claims29
A current collector comprising a biaxially oriented polyester substrate layer, a first metal layer on a side of the polyester substrate layer, and a second metal layer, wherein the first metal layer and the second metal layer are on opposing sides of the polyester substrate layer, wherein the polyester substrate layer exhibits positive thermal expansion in air at 200° C. in each of the transverse direction (TD) and machine direction (MD) and wherein the thermal expansion is measured according to the method in the description, wherein the polyester substrate layer has a thickness of no more than 12 μm, wherein the first metal layer has a thickness of no more than 1000 nm, and wherein the second metal layer independently has a thickness of no more than 1000 nm.
The use of a biaxially oriented polyester film as a substrate in a current collector which further comprises a first metal layer and a second metal layer, wherein said use is for imparting improved adhesion strength and delamination resistance between said substrate and metal layers, and wherein the polyester substrate layer exhibits positive thermal expansion in air at 200° C. in each of the transverse direction (TD) and the machine direction (MD) and wherein the thermal expansion is measured according to the method in the description, wherein the polyester substrate layer has a thickness of no more than 12 μm, wherein the first metal layer has a thickness of no more than 1000 nm, and wherein the second metal layer independently has a thickness of no more than 1000 nm.
Dependencies are inferred from the claim text.