Method of driving scan circuit, scan circuit, and display apparatus
AssigneesChengdu Boe Optoelectronics Technology Co., Ltd., Boe Technology Group Co., Ltd.
InventorsShuai Hou, Shuai Chen, Bin Wang
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AssigneesChengdu Boe Optoelectronics Technology Co., Ltd., Boe Technology Group Co., Ltd.
InventorsShuai Hou, Shuai Chen, Bin Wang
Estimating the term…
A method of driving a scan circuit includes providing N number of first clock signals time-sequentially to (k*N) number of stages of the scan circuit, respectively. The (k*N) number of stages includes M number of groups. A respective group of the M number of groups includes one or more stages of the scan circuit. A respective first clock signal of the N number of first clock signals includes a first level component and a second level component. With respect to N number of data enabling signals, a difference between a starting point of a first level component of an n-th first clock signal and a starting point of an n-th data enabling signal of the N number of data enabling signals is equal to tm1. Values of tm1 for first clock signals provided to different groups of the M number of groups are different.
A method of driving a scan circuit, comprising providing N number of first clock signals time-sequentially to (k*N) number of stages of the scan circuit, respectively, the (k*N) number of stages comprising M number of groups, a respective group of the M number of groups comprising one or more stages of the scan circuit, N, k, M being integers;
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A scan circuit, comprising:
Dependencies are inferred from the claim text.