Inspection apparatus and reference image generation method
AssigneeNuFlare Technology, Inc.
InventorShinji SUGIHARA
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AssigneeNuFlare Technology, Inc.
InventorShinji SUGIHARA
Estimating the term…
According to embodiments, an inspection apparatus includes an imaging mechanism, an image acquisition circuit that extracts an outline from image data of a sample, a development circuit that generates a developed image, an outline data generation circuit that generates data of an outline point of a pattern of the developed image, an area calculation circuit that calculates an area of a region not included in the pattern in a circle centered on the outline point, an estimation circuit that calculates a resizing amount of the outline point based on the area, and a reference image generation circuit that executes a resizing process of data of the outline point based on the resizing amount and generates a reference image based on the data of the outline point subjected to the resizing process.
An inspection apparatus comprising:
An inspection apparatus comprising:
A reference image generation method comprising:
A reference image generation method comprising:
Dependencies are inferred from the claim text.