Electrical voltage measuring device using an microelectromechanical system and optical interferometer interaction

An electrical voltage measuring device, comprising:

• at least one microelectromechanical device comprising a first electrode configured to be connected to an anode of an electrical voltage source and a second electrode configured to be connected to a cathode of said electrical voltage source, wherein the microelectromechanical device is configured to receive an electrical voltage from the electrical voltage source causing a displacement of the first electrode associated with said electrical voltage, wherein said displacement causes a variation of distance between the first electrode and the second electrode;
• and
• an optical processor comprising a laser and an optical sensor, the optical processor configured to:
• project using the laser a light beam through a laser light injection point on the first electrode;
• detect with the optical sensor reflections of the light beam, wherein a distance variation between the first electrode and the laser light injection point generates a variation of at least one reflection of the light beam;
• obtain interference patterns based on the light beam and the at least one reflection of the light beam;
• and
• calculate a value of the electrical voltage applied to the first electrode and the second electrode based on the interference patterns.