Epitaxial source or drain region with a wrapped conductive contact
AssigneeIntel Corporation
InventorHwichan Jun
Life of this patent
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AssigneeIntel Corporation
InventorHwichan Jun
Estimating the term…
Techniques are provided herein to form semiconductor devices having one or more epitaxial source or drain regions wrapped by a conductive contact to form an improved ohmic contact. A first semiconductor device includes a first semiconductor region extending between a first source or drain region and a second source or drain region, and a second semiconductor device includes a second semiconductor region extending between the first source or drain region and a third source or drain region. The first and second semiconductor devices include a subfin region adjacent to a dielectric layer. A conductive layer extends around the first source or drain region such that the conductive layer at least contacts the sidewalls of the first source or drain region and both upper and lower surfaces of the source or drain region. A dielectric layer is also present between the conductive contact and the subfin region.
An integrated circuit comprising:
An electronic device, comprising:
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Dependencies are inferred from the claim text.