Apparatus and methods for smart verify with adaptive voltage offset

A method comprising:

• programming a plurality of non-volatile memory cells coupled to a word line by:
• determining a minimum number of program loops needed to program a first set of the non-volatile memory cells to a particular programmed state;
• determining a first voltage based on the determined minimum number of program loops;
• determining a second voltage based on the first voltage and an adaptive voltage offset;
• and
• programming a second set of the non-volatile memory cells using the second voltage,
• wherein the adaptive voltage offset varies as a function of temperature.

An apparatus comprising:

• a memory die comprising a plurality of non-volatile memory cells;
• and
• a control circuit coupled to the non-volatile memory cells, the control circuit configured to:
• determine a chip temperature at one or more locations on the memory die;
• determine a value of an adaptive voltage offset based on the determined chip temperature;
• determine a minimum number of program loops needed to program a first plurality of the non-volatile memory cells to a particular programmed state;
• and
• determine an initial program voltage for programming a second plurality of the non-volatile memory cells,
• wherein the initial program voltage is based on the determined minimum number of program loops and the determined adaptive voltage offset.