Automated test pattern generation for testing design redacting reconfigurable hardware

A computing system comprising memory and one or more processors communicatively coupled to the memory, the one or more processors configured to:

• insert a scan chain into a reconfigurable hardware design associated with an integrated circuit comprising a redacted design;
• generate, using an automatic test pattern generation (ATPG) system, one or more test patterns and one or more bitstreams;
• receive one or more primary outputs and contents of the scan chain from the reconfigurable hardware design by applying the one or more test patterns and the one or more bitstreams to the reconfigurable hardware design based on an ATPG test method of a plurality of ATPG test methods and a test architecture of a plurality of test architectures;
• compare the one or more outputs and contents of the scan chain with one or more respective expected outcomes;
• and
• determine one or more faults associated with the reconfigurable hardware design based on the comparison.

One or more non-transitory computer-readable storage media including instructions that, when executed by one or more processors, cause the one or more processors to:

• insert a scan chain into a reconfigurable hardware design associated with an integrated circuit comprising a redacted design;
• generate, using an automatic test pattern generation (ATPG) system, one or more test patterns and one or more bitstreams;
• receive one or more primary outputs and contents of the scan chain from the reconfigurable hardware design by applying the one or more test patterns and the one or more bitstreams to the reconfigurable hardware design based on an ATPG test method of a plurality of ATPG test methods and a test architecture of a plurality of test architectures;
• compare the one or more outputs and contents of the scan chain with one or more respective expected outcomes;
• and
• determine one or more faults associated with the reconfigurable hardware design based on the comparison.