Probe assembly, system and method for testing rf device of phased array antenna
AssigneeTron Future Tech Inc.
InventorsYU-JIU WANG, HAO-CHUNG CHOU, YUE MING WU, TA-SHUN CHU
Life of this patent
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Abstract
A method for manufacturing a first radio-frequency (RF) device, including: receiving a substrate having the first RF device, wherein the first RF device has a signal port for receiving or transmitting RF signals with an input impedance greater than ten times an input impedance of a testing tool; causing a probe assembly to connect to the signal port and the testing tool; and causing the probe assembly to connect to a first terminal of a resistive element having a resistance equal to the input impedance.
Claims20
A method for testing radio-frequency (RF) device, comprising:
- receiving a first RF device having a signal port for transmitting RF signals;
- arranging a first probe needle of a probe assembly to couple to the signal port;
- arranging a testing tool to couple to the probe assembly for testing the first RF device through the probe assembly;
- and
- arranging a first resistive element to couple to the first probe needle in parallel connection to make a first input impedance looking into the probe assembly from the testing tool substantially equal to a second input impedance looking into the testing tool from the probe assembly.
A probe assembly for testing a radio-frequency (RF) device, the probe assembly comprising:
- a first probe needle configured to contact a signal port of the RF device;
- a first connecting port configured to electrically connect to a second connecting port of a testing tool used for testing the RF device through the probe assembly;
- and
- a first resistive element configured to couple to the first probe needle in parallel connection to make a first input impedance looking into the first connecting port substantially equal to a second input impedance looking into the second connecting port.
A testing system comprising:
- a radio-frequency (RF) device having a signal port;
- a probe assembly having a probe needle configured to couple to the signal port;
- a testing tool having a first connecting port coupled to a second connecting port of the probe assembly, the testing tool used for testing the RF device through the probe assembly;
- and
- a resistive element configured to couple to the probe needle in parallel connection to make a first input impedance looking into the first connecting port substantially equal to a second input impedance looking into the second connecting port.
Dependencies are inferred from the claim text.