Particle analyzing device, and particle analyzing method

A particle analyzing device for analyzing a predetermined particle to be analyzed, placed on an instrument, with an electron microscope, wherein

• the particle analyzing device acquires a first standard value and a second standard value regarding brightness in an electron microscope image,
• the particle analyzing device acquires an electron microscope image and a signal profile generated by irradiating the instrument and the particle with an electron beam,
• the particle analyzing device adjusts brightness of the electron microscope image based on the first standard value, the second standard value, and the signal profile,
• the instrument includes a first region having different brightness from the particle and a second region having different brightness from the particle and the first region when observed with the electron microscope,
• the first standard value is a value determined based on brightness of the first region, and
• the second standard value is a value determined based on brightness of the second region.