Optical measurement apparatus
AssigneesNational University Corporation Nagaoka University of Technology, Opt Gate Co., Ltd.
InventorsMORITSUGU SAKAMOTO, HIROSHI ONO, KOHEI NODA, MASAYUKI TANAKA
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AssigneesNational University Corporation Nagaoka University of Technology, Opt Gate Co., Ltd.
InventorsMORITSUGU SAKAMOTO, HIROSHI ONO, KOHEI NODA, MASAYUKI TANAKA
Estimating the term…
Provided is an optical measurement apparatus including: a polarized light irradiation unit 10 that irradiates a subject Ob with irradiation light of which polarization is controlled; and a polarization imaging unit 20 that images a polarization state of measurement light occurring due to scattering, reflection, absorption, or the like of the irradiation light by the subject Ob, calculates all or a part of Stokes parameters of the measurement light, and measures a variation of a polarized component occurring between the irradiation light and the measurement light due to the subject Ob. Since the subject is irradiated with irradiation light of which a polarization state is controlled, it is possible to acquire subject information that is difficult to measure in a case of irradiating the subject with natural light, that is, non-polarized irradiation light, and it is also possible to suppress noise or a decrease in contrast that occurs when measuring polarization by irradiating the subject with irradiation light of which a polarization state is unstable.
An optical measurement apparatus, comprising:
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Dependencies are inferred from the claim text.