US 2024/0201041 A1 · Method and System for Defect Detection

Abstract

A method of defect detection is provided for a pressurized pipe having an upstream node and a downstream node. The method comprises generating, by a wave source located at xS at the downstream node, a transient wave travelling in a direction from the downstream node towards the upstream node, measuring, by a pressure sensor located at xR upstream of the wave source, a transient response caused by the transient wave to obtain a measured signal; and processing, by a computer device to execute a time-reversal (TR) algorithm, the measured signal for determining one or more defects of the pressurized pipe.

Claims20

Dependent claims

A method of defect detection for a pressurized pipe having an upstream node and a downstream node, the method comprising:

generating, by a wave source located at xS at the downstream node, a transient wave travelling in a direction from the downstream node towards the upstream node;
measuring, by a pressure sensor located at xR upstream of the wave source, a transient response caused by the transient wave to obtain a measured signal;
and
processing, by a computer device to execute a time-reversal (TR) algorithm, the measured signal for determining one or more defects of the pressurized pipe.

1 more element

A system of defect detection for a pressurized pipe having an upstream node and a downstream node, a wave source being located at xS at the downstream node and configured to generate a transient wave travelling in a direction from the downstream node towards the upstream node, the system comprising:

a pressure sensor located at xR upstream of the wave source and configured to measure the transient wave to obtain a measured signal;
and
a computer device configured to control the pressure sensor and to execute a process comprising:
receiving the measured signal from the pressure sensor;
truncating the measured signal at a truncation point located at xT along the pressurized pipe to obtain a truncated signal denoted as Δhm(tR);
reversing the truncated signal in time domain to obtain a time-reversed signal denoted as Δhm(−tR);
computing an objective function given by
B
⁡
(
x
^
D
)
=
[
g
C
(
t
R
,
x
^
D
)

g
C
(
t
R
,
x
^
D
)

*
Δ
⁢
h
m
(
-
t
R
,
x
D
)
]
t
R
=
0
;
and
determining defect location by computing
x
^
D
=
arg
⁢
max
⁢
B
⁡
(
x
^
D
)
x
^
D
:=
{
❘
"\[LeftBracketingBar]"
B
⁡
(
x
^
D
)
❘
"\[RightBracketingBar]"
>
γ
❘
x
^
D
∈
X
^
D
,
x
^
D
∉
Ω
BC
}
where tR is a variable and tR∈[0, 2xT/a0];
a0 denotes wave speed;
{circumflex over (X)}D=(Δ{circumflex over (x)}D, 2Δ{circumflex over (x)}D, . . . , xT) is a vector for potential defect locations;
Δ{circumflex over (x)}D≤0.5/min;
λmin=a0/fmax;
fmax is a maximal frequency of the transient wave;
xD is a true vector of defect locations;
gC(tR, {circumflex over (x)}D) is a preset model response;
represents a convolution operator;
[⋅]tR=0 represents a function [⋅] evaluated at tR=0;
∥⋅∥ represents Euclidean norm of a function;
γ
=
max
⁢
(
[
n
⁡
(
t
R
)
⊗
g
C
(
t
R
,
x
^
D
)

g
C
(
t
R
,
x
^
D
)

]
⁢
(
t
R
=
0
)
)
;
[
n
⊗
g
]
⁢
(
t
R
=
0
)
denotes cross-correlation between n and g evaluated at tR=0;
and
ΩBC denotes a set of known locations of boundaries.

176 more elements

Dependencies are inferred from the claim text.

Method and System for Defect Detection

Life of this patent

Method and System for Defect Detection

Life of this patent

Abstract

Claims20