Characteristic value correction device, characteristic value calculation device, inspection device including the same, characteristic value correction method, light-emitting device, and characteristic value correction program

A characteristic value calculation device for calculating a characteristic value of a light-emitting device using a first current value actually flowing through the light-emitting device when a pulse current is applied to the light-emitting device to inspect a characteristic of the light-emitting device in an inspection device that inspects the characteristic of the light-emitting device, the characteristic value calculation device comprising:

• a waveform acquiring unit configured to acquire a waveform indicating a relationship between an elapsed time and the first current value obtained when the pulse current is applied to the light-emitting device;
• a graph replacement processing unit configured to replace the waveform acquired in the waveform acquiring unit with a graph of a rectangular wave indicating a relationship between an elapsed time and the characteristic value based on a relationship between a current value flowing through the light-emitting device and the characteristic value;
• and
• a characteristic value calculating unit configured to integrate the graph of the rectangular wave to calculate the characteristic value of the light-emitting device.

A characteristic value correction method for correcting a characteristic value of a light-emitting device using a first current value actually flowing through the light-emitting device when a pulse current is applied to the light-emitting device to inspect a characteristic of the light-emitting device in an inspection device that inspects the characteristic of the light-emitting device, the characteristic value correction method comprising:

• acquiring a waveform indicating a relationship between an elapsed time and the first current value obtained when the pulse current is applied to the light-emitting device;
• calculating a first area of an entire waveform acquired in the acquiring of the waveform and a second area of a rectangular wave portion where the first current value is stable in the waveform;
• calculating a first time between an application start time and an application end time of the pulse current of the entire waveform and a second time corresponding to the second area;
• and
• obtaining a correction coefficient based on a ratio between the first area and the second area and a ratio between the first time and the second time.

A non-transitory computer-readable medium having stored thereon a characteristic value correction program for correcting a characteristic value of a light-emitting device using a first current value actually flowing through the light-emitting device when a pulse current is applied to the light-emitting device to inspect a characteristic of the light-emitting device in an inspection device that inspects the characteristic of the light-emitting device, the characteristic value correction program causing a computer to execute a characteristic value correction method comprising:

• acquiring a waveform indicating a relationship between an elapsed time and the first current value obtained when the pulse current is applied to the light-emitting device;
• calculating a first area of the entire waveform acquired in the acquiring of the waveform and a second area of a rectangular wave portion where the first current value is stable in the waveform;
• calculating a first time between an application start time and an application end time of the pulse current of the entire waveform and a second time corresponding to the second area;
• and
• obtaining a correction coefficient based on a ratio between the first area and the second area and a ratio between the first time and the second time.