Measurement device and board inspection device
AssigneeYamaha Hatsudoki Kabushiki Kaisha
InventorsTakahiro MATSUKUBO, Takeshi ARAI
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AssigneeYamaha Hatsudoki Kabushiki Kaisha
InventorsTakahiro MATSUKUBO, Takeshi ARAI
Estimating the term…
A measurement device includes an imager, a first projector to project a linear first measurement light beam onto a measurement target from a direction inclined at a first angle, and a second projector to project a linear second measurement light beam onto the measurement target from a direction inclined at a second angle. The measurement device further includes a controller configured or programmed to remove reflected light noise based on the first measurement light beam and the second measurement light beam projected onto the measurement target and imaged by the imager and acquire height information of the measurement target.
A measurement device comprising:
A board inspection device comprising:
A measurement device comprising:
A board inspection device comprising:
Dependencies are inferred from the claim text.