Method for Analyzing Samples Including a High M/Z Cutoff
AssigneeDH Technologies Development Pte. Ltd.
InventorsLeigh BEDFORD, Thomas R. COVEY, James HAGER, Bradley B. SCHNEIDER
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AssigneeDH Technologies Development Pte. Ltd.
InventorsLeigh BEDFORD, Thomas R. COVEY, James HAGER, Bradley B. SCHNEIDER
Estimating the term…
In one aspect, a method of performing mass spectrometric analysis of a sample, e.g. a food-based sample, is disclosed, which comprises ionizing the sample to generate a plurality of ions, introducing the plurality of ions into a mass filter configured to provide a high m/z cutoff greater than a maximum m/z ratio of ions associated with one or more analytes of interest in the sample so as to allow passage of the analyte ions while inhibiting passage of ions having m/z ratios above said high m/z cutoff, and performing a mass analysis of ions passing through said mass filter. In a related aspect, a mass spectrometer is disclosed, which comprises an atmospheric pressure ion source, a first mass filter, a user interface and a controller.
A mass spectrometer, comprising:
The mass spectrometer of claim 4, wherein said reduced pressure chamber is maintained at a pressure in a range of about 2 mTorr to about 20 mTorr.
A method of performing mass spectrometric analysis of a sample, comprising:
Dependencies are inferred from the claim text.