Mass spectrometer and method for controlling same
AssigneeHitachi High-Tech Corporation
InventorsMasuyuki Sugiyama, Hideki Hasegawa, Yuka Sugawara, Riku Tamura, Hiroyuki Yasuda, Yuichiro Hashimoto
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AssigneeHitachi High-Tech Corporation
InventorsMasuyuki Sugiyama, Hideki Hasegawa, Yuka Sugawara, Riku Tamura, Hiroyuki Yasuda, Yuichiro Hashimoto
Estimating the term…
Provided are a mass spectrometer and a method for controlling the same capable of suppressing decrease in sensitivity even where the atmospheric pressure around the mass spectrometer varies. The mass spectrometer includes an ion source, a mass analysis unit, a control unit, and a storage unit. The ion source includes an ion source chamber, an inlet, a first gas introduction port, a second gas introduction port, an outlet, and a gas discharge port. The storage unit stores a table indicating a relationship between a measurement condition and a flow rate of the second gas. The control unit changes the flow rate of the second gas according to the measurement condition on the basis of the table, and controls a flow rate of the first gas to suppress a variation in a pressure inside the ion source chamber.
A mass spectrometer comprising:
A method for controlling a mass spectrometer, the method comprising:
Dependencies are inferred from the claim text.