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US 2024/0177791 A1Published application
Semiconductor device and method of testing the semiconductor device
AssigneeSK hynix Inc.
InventorJun Hyuk LEE
Life of this patent
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Abstract
Provided herein is a semiconductor device and a method of testing the semiconductor device. The method of operating a semiconductor device includes initializing a latch included in a page buffer, applying a read pass voltage to a plurality of word lines, allowing at least one of the plurality of word lines to float, and performing a sensing operation on the page buffer.
Claims16
A method of operating a semiconductor device, comprising:
- initializing a latch included in a page buffer;
- applying a read pass voltage to a plurality of word lines;
- allowing at least one of the plurality of word lines to float;
- and
- performing a sensing operation on the page buffer.
2 more elements
A method of operating a semiconductor device, comprising:
- initializing a latch included in a page buffer;
- applying a turn-on voltage to at least one of a plurality of select lines coupled to a memory block;
- applying a read pass voltage to a plurality of word lines;
- allowing the at least one select line to float;
- and
- performing a sensing operation on the page buffer.
3 more elements
A semiconductor device, comprising:
- a memory cell array including a plurality of memory cells;
- a page buffer coupled to the memory cell array through a bit line;
- an address decoder coupled to the memory cell array through select lines and word lines;
- and
- control logic configured to control operations of the page buffer and the address decoder,
- wherein the control logic is configured to control the page buffer and the address decoder to initialize a latch included in the page buffer, apply a read pass voltage to the word lines, allow at least one of the word lines and the select lines to float, and perform a sensing operation on the page buffer.
3 more elements
Dependencies are inferred from the claim text.