Apparatus and method for programming and verifying data in a nonvolatile memory device
AssigneeSK hynix Inc.
InventorsHyung Jin CHOI, Gwi Han KO
Life of this patent
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AssigneeSK hynix Inc.
InventorsHyung Jin CHOI, Gwi Han KO
Estimating the term…
A memory device comprising: a memory cell array comprising multiple memory cells, and a controller configured to repeatedly perform a program loop comprising a voltage application interval and a verification interval until a program operation for cells that have been connected to a word line that have been selected as a program target reach a threshold voltage level and configured to adjust an increase in a level of a program voltage that is applied to the selected word line in the voltage application interval of a second program loop following a first program loop, based on a result of a comparison between a threshold voltage level of each of cells that have been selected as a verification target, among the cells that have been connected to the selected word line, and a pre-target level in the verification interval of the first program loop, among the program loops that are repeated.
A memory device comprising:
An operating method of a memory device, comprising:
Dependencies are inferred from the claim text.