Film forming method, processing apparatus, and processing system
AssigneeTokyo Electron Limited
InventorsMunehito KAGAYA, Hiroki MURAKAMI
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AssigneeTokyo Electron Limited
InventorsMunehito KAGAYA, Hiroki MURAKAMI
Estimating the term…
An aspect of the present disclosure provides a film forming method of embedding a film in a recess that is formed in a substrate and has a narrow portion, the method comprising: an operation (a) of forming the film in the recess under a condition that the film is formed thicker at an opening than at a bottom portion of the recess; an operation (b) of forming the film in the recess under a condition that the film is formed with a same thickness at both the bottom portion of the recess and the opening of the recess, or a condition that the film is formed thicker at the bottom portion of the recess than at the opening of the recess; and an operation (c) of partially etching the film formed in the recess, wherein multiple cycles, each of which including the operation (b) and the operation (c), are performed
1-15:
A film forming method of embedding a film in a recess that is formed in a substrate and has a narrow portion, the film forming method comprising:
A processing apparatus for performing a film forming method of embedding a film in a recess that is formed in a substrate and has a narrow portion, comprising:
A processing system for performing a film forming method of embedding a film in a recess that is formed in a substrate and has a narrow portion, comprising:
Dependencies are inferred from the claim text.